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Present the device through the installed input module and package-specific tooling.
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Look beyond headline throughput and review the complete test cell.
The FT2018 combines high-speed turret handling, parallel test capability, six-sided vision and tape-and-reel options for small semiconductor packages. For a buyer, the real question is whether the listed machine can handle the package, connect with the required tester and contact hardware, and deliver the intended output format.
Reference image and published platform information only. Current availability, installed test stations, tester interface, packing modules, software and machine condition must be confirmed for the individual unit.
Open the product page to review the published machine record. Availability, year, installed test sites, tester interface, input and output modules, included accessories and refurbishment scope should be confirmed before quotation.
The FT2018 coordinates device handling, electrical-test presentation, vision inspection, result-based sorting and final packing in one production route.
Present the device through the installed input module and package-specific tooling.
Orient and position the package before the device reaches the contact station.
Coordinate the handler with the tester, contactor and active test-site strategy.
Use the installed vision functions to inspect device surfaces and orientation.
Route pass, fail or classified devices according to the test result and recipe.
Complete the selected tape, reel or other output process with the required checks.
These values identify the published platform level. They do not confirm the measured output, active options or condition of a specific used machine.
A fast turret is only one part of the production result. The device program, usable test sites, contact stability and output process determine whether the machine can deliver useful accepted units per hour.
Start with the electrical program. A 30 ms reference does not describe every product. Longer test time may increase the value of parallel stations if the tester and interface support them.
Installed and usable are different questions. Confirm the number of fitted stations, tester resources, interface mapping and whether the project can use the intended parallel strategy.
Retest can remove the benefit of speed. Package planarity, socket condition, alignment, force and maintenance history all affect effective output.
The output module must fit the product. Tape width, pocket format, sealing requirements, post-seal inspection and reel-change options should be included in the machine review.
The FT2018 is the mechanical and handling center of the test cell. Package conversion hardware sits upstream, while the contactor, interface and ATE complete the electrical-test path. For a broader comparison, review the turret test handler category.
Package dimensions, orientation, nozzles, nests, guides, input media and product-specific change parts define how the device reaches the handler.
Pickup, turret indexing, alignment, presentation to the active test sites, six-sided inspection, result-based sorting and the installed output modules.
Socket or contactor, interface board, test-site mapping, tester resources, electrical program and result communication complete the test cell. Review the available semiconductor tester resources separately.
Share the package drawing, dimensions, thickness, surface sensitivity and input form.
What we reviewNozzles, nests, guides, orientation hardware, contact-force needs, input modules and the available package-specific change parts.
Define the tester model, test time, target site count and intended simultaneous or sequential strategy.
What we reviewInstalled test positions, contact hardware, interface records, communication, tester mapping and which sites can actually support the project.
Explain the inspection criteria, orientation, package-protection concerns and required output format.
What we reviewCamera and lighting setup, six-sided inspection, contact-control options, installed output modules, software and included tooling.
A useful first discussion does not require a complete handler specification. A package drawing, tester reference and production target are enough to organize the next machine-level questions.
Not sure the FT2018 is the right direction? Compare the wider turret-handler category, browse available test handlers, or review the semiconductor tester side of the test cell.
The published device-size range is approximately 1 × 1 mm² to 6 × 6 mm². Actual suitability also depends on thickness, shape, surface sensitivity, nozzle configuration, contact hardware and the installed machine options.
No. The platform supports up to eight parallel test stations, but the installed quantity and usable test strategy must be confirmed on the individual machine together with the tester interface and available resources.
The published reference is 50,000+ UPH at a 30 ms test time. Actual accepted output depends on test duration, active sites, contact yield, inspection requirements, package handling, input and output configuration and machine condition.
A package drawing, tester model, approximate test time, required site count, input and output route and target throughput are enough to begin. Machine year, serial number, software, modules, tooling and condition can then be checked against the available record.
Share the package, tester and output requirements. We will use the available FT2018 product and machine information to clarify the likely fit, missing configuration points and the scope worth pricing.
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